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Researcher
Anthony Coyette
- Disciplines:Nanotechnology, Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Design theories and methods
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → 15 Jan 2018 - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From10 Sep 2012 → 15 Jan 2018
Projects
1 - 1 of 1
- Automatic Defect-Oriented Test Generation for Analog and Mixed-Signal Integrated CircuitsFrom10 Sep 2012 → 4 Dec 2017Funding: Own budget, for example: patrimony, inscription fees, gifts
Publications
1 - 10 of 16
- Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems(2018)
Authors: Georges Gielen, Vahap Baris Esen, Anthony Coyette, Nektar Xama
Number of pages: 4 - ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed-Signal Integrated Circuits(2018)
Authors: Anthony Coyette, Nektar Xama, Georges Gielen
Pages: 24 - 30 - An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes(2018)
Authors: Anthony Coyette, Nektar Xama, Georges Gielen
Pages: 15 - 23 - Non-intrusive detection of defects in mixed-signal integrated circuits using light activation(2018)
Authors: Vahap Baris Esen, Anthony Coyette, Nektar Xama, Georges Gielen
Pages: 1 - 7 - Automatic Testing of Analog ICs for Latent Defects using Topology Modification(2017)
Authors: Nektar Xama, Anthony Coyette, Vahap Baris Esen, Georges Gielen
Pages: 1 - 6 - A very low cost and highly parallel DfT method for analog and mixed-signal circuits(2017)
Authors: Vahap Baris Esen, Anthony Coyette, Nektar Xama, Georges Gielen
Pages: 1 - 2 - Effective DC fault models and testing approach for open defects in analog circuits(2017)
Authors: Vahap Baris Esen, Anthony Coyette, Georges Gielen
Pages: 1 - 9 - Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis(2016)
Authors: Anthony Coyette, Vahap Baris Esen, Georges Gielen
Number of pages: 10 - Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization(2016)
Authors: Anthony Coyette, Vahap Baris Esen, Georges Gielen
Pages: 393 - 400 - Analog Fault Coverage Improvement using Final-Test Dynamic Part Average Testing(2016)
Authors: Anthony Coyette, Georges Gielen
Number of pages: 9