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Project

X-ray computed tomography for the quantitative analysis of materials and processes.

Scientists and engineers retrieve from X-ray CT images quantitative data of the internal (damaged) structure of a material or its architecture in order to characterize the material and to feed mechanical, statistical or multiscale models of the material behavior or the damaging processes taking place due to external influences.
Date:1 Oct 2016 →  30 Sep 2018
Keywords:tomography
Disciplines:Ceramic and glass materials, Materials science and engineering, Semiconductor materials, Other materials engineering