Researcher

Armand Béché

Research Expertise:My research area is concentrated around transmission electron microscopy (TEM) applied to material science. I am specialized in a large number of techniques including strain measurement, high resolution imaging, EELS spectroscopy, electron beam phase manipulation and instrument development. Thanks to a background on engineering in material science, I spend my PhD developing TEM techniques for measuring strain at the nanoscale applied for microelectronic devices. At the end of my PhD in 2009, I joined FEI (now ThermoFisher Scientific) as an application specialist on TEM. Three years later (2012), I joined the UA as a post doc dedicated on the development and implementation of electron vortex beams. My topic eventually shifted to the development of compressed sensing to reduce beam damage in STEM imaging. In 2017, I became responsible of the microscopy center of the EMAT group.

Keywords:MATERIAL SCIENCES, HOLOGRAPHY (ELECTRON), ELECTRON MICROSCOPY, ELECTRON DIFFRACTION, ELECTRON TOMOGRAPHY, STRAIN, X-RAY SPECTROMETRY, ELECTRON ENERGY LOSS SPECTROSCOPY, Physics (incl. astronomy)

Disciplines:Atomic and molecular physics, Classical physics, Condensed matter physics and nanophysics, Materials physics, Optical physics, Quantum physics, Other physical sciences

Research techniques:Transmission electron microscopy, including - High resolution imaging (TEM, STEM) with correction - EELS with monochromated illumination - Electron holography - Electron tomography - Phase manipulation and exotic beams (vortex, Airy and Bessel beams...) - Compressed sensing and related low dose mode Scanning electron microscopy Focus Ion Beam microscopy