A quasi-llinear deterministic variation-aware circuit reliability simulation methodology

This paper demonstrates an innovative, deterministic, variation-aware reliability modeling and simulation methodology to efficiently simulate failure-time dispersion in circuits subjected to die-level stress effects. The proposed method uses a highly computational efficient response surface model (RSM), based on radial basis functions, to ensure full coverage of the design space and to reduce simulation time. The RSM is based on the results of an experimental design setup (DoE) with a quasi-linear complexity. The DoE uses a systematic fractional replicate screening design, to screen out important circuit factors and to guarantee a limited RSM complexity. A resolution V fractional factorial design and a central composite design guarantee a good model accuracy. The method is validated over a broad range of both analog and digital circuits and compared to traditional Monte-Carlo reliability simulation techniques. It is shown to outperform existing simulators with a simulation speed improvement of up to several orders of magnitude. Also, it is proven to have a good simulation accuracy, with an average model error varying from 1.5 to 5 $\%$ over all test circuits.

ISBN:978-3-9810801-6-2

Publication year:2010