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Publication
Observation of Dynamic VTH of p-GaN Gate HEMTs by Fast Sweeping Characterization
Journal Contribution - Journal Article
Journal: IEEE Electron Device Letters
ISSN: 0741-3106
Issue: 4
Volume: 41
Pages: 577 - 580
Publication year:2020
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:3
Authors from:Government, Higher Education
Accessibility:Closed