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Project

B budget True Atom (True atom probe tomography for semiconductor) 2020.

Atom probe tomography is an analysis tool in materials science that allows to inspect the 3D chemical composition of needle shaped samples at the nano scale. The method works by field-induced evaporation. Ions are then consecutively emitted from the apex of the needle and are absorbed by a position sensitive detector. The result is a tomographic, atomically resolved image of the evaporated volume, represented as a point cloud in which each point is an atom. The current reconstruction approaches however were developed with homogeneous samples in mind and do not account for the complex shape of the sample surface, which evolves during the field evaporation process. The goal of this project is to develop new reconstruction methods that take the shape into account.
Date:1 Jan 2020 →  31 Dec 2020
Keywords:TOMOGRAPHY, SEMICONDUCTORS
Disciplines:Modelling and simulation, Data visualisation and imaging, Signal processing not elsewhere classified