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Publication

Impact of Mechanical Stress on 3-D NAND Flash Current Conduction

Journal Contribution - Journal Article

Journal: IEEE Transactions on Electron Devices
ISSN: 0018-9383
Issue: 11
Volume: 67
Pages: 4891 - 4896
Publication year:2020
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors from:Government, Higher Education
Accessibility:Open