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Publication

Investigation of the Impact of Externally Applied Out-of-Plane Stress on Ferroelectric FET

Journal Contribution - Journal Article

Journal: IEEE Electron Device Letters
ISSN: 0741-3106
Issue: 2
Volume: 42
Pages: 264 - 267
Publication year:2021
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors from:Government, Higher Education
Accessibility:Closed