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Publication

3D-printed optical probes for wafer-level testing of photonic integrated circuits

Journal Contribution - Journal Article

Journal: OPTICS EXPRESS

ISSN: 1094-4087

Issue: 25

Volume: 28

Pages: 37996 - 38007

Publication year:2020

DOI: https://doi.org/10.1364/oe.405139
WoS Id: 000596707100073
Handle: http://hdl.handle.net/1854/LU-8703521

Accessibility:Open