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Publication
Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge
Journal Contribution - Journal Article
Journal: Microelectronics Reliability
ISSN: 0026-2714
Volume: 119
Publication year:2021
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors:International
Authors from:Higher Education
Accessibility:Open