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Patent

Atomic force microscopy probes with an assembly of metal nanowires and dielectrophoretic method for attaching and detaching said metal nanowires to and from said probes

The present invention relates to (i) a commercially available atomic force microscopy cantilever with an assembly of chemically-synthesized noble metal nanowires attached to it, without the use of an adhesive, (ii) controllable methods to attach an assembly of chemically-synthesized noble metal nanowires to said cantilever and (iii) the use of the commercially available atomic force microscope cantilever with assembly of nanowires in techniques such as surface topographic scanning with atomic force microscopy, nanoscale chemical analysis using near-field optical microscopy and with particular reference to chemical analysis such as DNA mapping, mapping active sites of catalysts, evaluating anisotropy of surfaces and surface properties, such as graphene.
Patent Publication Number: WO2019008108
Year filing: 2019
Year approval: 2020
Year publication: 2019
Status: Requested
Technology domains: Measurement, Micro-structure and nano-technology
Validated for IOF-key: Yes
Attributed to: Associatie KULeuven