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Researcher
Elie Maricau
- Disciplines:Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Nanotechnology, Design theories and methods
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → 30 Sep 2012 - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From1 Dec 2007 → 30 Sep 2012 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 2007 → 30 Nov 2007
Publications
11 - 18 of 18
- A quasi-llinear deterministic variation-aware circuit reliability simulation methodology(2010)
Authors: Elie Maricau, Georges Gielen
Pages: 1094 - 1099 - NBTI model for analog IC reliability simulation(2010)
Authors: Elie Maricau, Georges Gielen
Pages: 1279 - 1280 - Modeling and design for reliability of analog integrated circuits in nanometer CMOS technologies(2010)
Authors: Georges Gielen, Elie Maricau, Pieter De Wit
Pages: 3 - 16Number of pages: 14 - A Methodology for Measuring Transistor Ageing Effects Towards Accurate Reliability Simulation(2009)
Authors: Elie Maricau, Georges Gielen
Pages: 21 - 26 - Efficient Reliability Simulation of Analog ICs Including Variability and Time-varying Stress(2009)
Authors: Elie Maricau, Georges Gielen
Pages: 1238 - 1241 - Emerging yield and reliability challenges in nanometer CMOS technologies(2008)
Authors: Georges Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, J Martín-Martínez, B Kaczer, Guido Groeseneken, R Rodríguez, M Nafría
Pages: 1322 - 1327 - Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies(2008)
Authors: Georges Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Guido Groeseneken
Pages: 1322 - 1327 - An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications(2008)
Authors: Elie Maricau, Pieter De Wit, Georges Gielen
Pages: 1576 - 1580