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Researcher
Jacopo Franco
- Disciplines:Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Nanotechnology, Design theories and methods
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → 31 Jan 2013 - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From1 Feb 2009 → 31 Jan 2013
Publications
1 - 10 of 88
- Record performance InGaAs homo-junction TFET with superior SS reliability over MOSFET(2015)
Authors: Ali Reza Alian, Jacopo Franco, Anne Verhulst, Devin Verreck
Pages: 823 - 826 - Gate-all-around InGaAs nanowire FETs with peak transconductance of 2200 µS/µm at 50nm Lg using a replacement fin RMG flow(2015)
Authors: Niamh Waldron, Jacopo Franco, Abhitosh Vais, Clement Merckling, Kristin De Meyer
Pages: 3111 - 3114 - On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires(2015)
Authors: Geert Hellings, Hiroaki Arimura, Jacopo Franco
Pages: 366 - 369 - Characterization and simulation methodology for time-dependent variability in advanced technologies(2015)
Authors: Jacopo Franco, Marko Simicic, Francky Catthoor, Guido Groeseneken
Pages: 1 - 8 - NBTI in Si0.55Ge0.45 cladding p-FinFETs: porting the superior reliability from planar to 3D architectures(2015)
Authors: Jacopo Franco, Guido Groeseneken
Pages: 41 - 45 - Extraction of the random component of time-dependent variability using matched pairs(2015)
Authors: Jacopo Franco, Guido Groeseneken
Pages: 300 - 302 - AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction(2015)
Authors: Jacopo Franco, Guido Groeseneken
Number of pages: 2 - TCAD-based methodology for reliability assessment of nanoscaled MOSFETs(2015)
Authors: Jacopo Franco
Pages: 270 - 273 - Si-cap-free SiGe p-channel Fin FETS and gate-all-around transistors in a replacement metal gate Process: interface trap density reduction and performance improvement by high-pressure deuterium anneal(2015)
Authors: Hiroaki Arimura, Jacopo Franco, Diana Tsvetanova
Pages: 142 - 143 - Reliability aware simulation flow: from TCAD calibration to circuit level analysis(2015)
Authors: Marko Simicic, Jacopo Franco
Pages: 152 - 155
Patents
1 - 2 of 2
- Breakdown-based physical unclonable function (Inventor)
- Breakdown-based physical unclonable function (Inventor)