< Back to previous page
Researcher
Michiel Vandemaele
- Disciplines:Nanotechnology, Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Design theories and methods
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → Today - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From1 Oct 2014 → 31 Jul 2020
Projects
1 - 1 of 1
- Unified Physics-Based Model of Degradation of FinFETs and Nanowire FETs for beyond 7 nm TechnologiesFrom21 Sep 2017 → 4 Oct 2023Funding: FWO fellowships
Publications
1 - 10 of 18
- Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study(2023)
Authors: Michiel Vandemaele, Guido Groeseneken
Pages: 197 - 200 - The impact of self-heating and its implications on hot-carrier degradation-A modeling study(2021)
Authors: Michiel Vandemaele
- Modeling of Repeated FET Hot-Carrier Stress and Anneal Cycles Using Si-H Bond Dissociation/Passivation Energy Distributions(2021)
Authors: Michiel Vandemaele, Guido Groeseneken
Pages: 1454 - 1460 - A BSIM-Based Predictive Hot-Carrier Aging Compact Model(2021)
Authors: Yang Xiang, Michiel Vandemaele, Zhicheng Wu
Pages: 1 - 9 - Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach(2020)
Authors: Michiel Vandemaele
- A Compact Physics Analytical Model for Hot-Carrier Degradation(2020)
Authors: Michiel Vandemaele
Number of pages: 7 - The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation(2020)
Authors: Michiel Vandemaele, Guido Groeseneken
Number of pages: 7 - Array-based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {VG,VD} bias space(2019)
Authors: Kent Chuang, Michiel Vandemaele
Number of pages: 6 - Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs(2019)
Authors: Michiel Vandemaele
Number of pages: 7 - Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs(2019)
Authors: Michiel Vandemaele, Guido Groeseneken
Number of pages: 7