< Back to previous page
Researcher
Wim Dewulf
- Disciplines:Dimensional metrology, Life cycle engineering
Affiliations
- Manufacturing Processes and Systems (MaPS) (Division)
Member
From1 Aug 2020 → 30 Sep 2022 - Industrial Management/Traffic and Infrastructure (CIB) (Division)
Member
From1 Aug 2020 → 30 Sep 2013 - Mechanical Engineering Technology, Group T Leuven Campus (Technology cluster)
Member
From1 Oct 2013 → 31 Jul 2020
Projects
1 - 10 of 54
- Development of regularized reconstructions for industrial computed tomographyFrom29 Nov 2023 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Computer vision and XRT imaging for circular economyFrom7 Nov 2023 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- AUtonomous Demanufacturing of batteRy driven products (AUDRI)From1 Oct 2023 → TodayFunding: IOF - technology concept exploration
- Effectiveness and efficiency of GHG reduction measures and their impact on the final product’s footprint under future uncertaintyFrom27 Feb 2023 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Development of a hybrid data-driven / model-based regularization method for X-ray CT-metrologyFrom1 Jan 2023 → TodayFunding: FWO research project (including WEAVE projects)
- How to measure capabilities and align expectations of first year students in Engineering TechnologyFrom12 Oct 2022 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Product condition evaluation using deep learning for a circular economyFrom15 Sep 2022 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Development of an accurate, real-time fringe projection system for high dynamic range 3D measurements of semi-reflective partsFrom1 Sep 2022 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- CT based process planning and build preparation for AMFrom27 Jun 2022 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Determination of taskspecific measurement uncertainty caused by geometrical misalignmentsFrom25 Apr 2022 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
Publications
31 - 40 of 232
- A Micro-Computed Tomography Comparison of the Porosity in Additively Fabricated CuCr1 Alloy Parts Using Virgin and Surface-Modified Powders(2021)
Authors: Mirko Sinico, Suraj Dinkar Jadhav, Ann Witvrouw, Kim Vanmeensel, Wim Dewulf
- On the influence of second use, future battery technologies, and battery lifetime on the maximum recycled content of future electric vehicle batteries in Europe(2021)
Authors: Mohammad Abdelbaky, Jef Peeters, Wim Dewulf
Pages: 1 - 9 - Error compensation for laser line scanners(2021)
Authors: Michiel Vlaeyen, Han Haitjema, Wim Dewulf
- Comparing the environmental performance of industrial recycling routes for lithium nickel-cobalt-manganese oxide 111 vehicle batteries(2021)
Authors: Mohammad Abdelbaky, Jef Peeters, Wim Dewulf
Pages: 97 - 102 - Life cycle inventory of samarium-cobalt permanent magnets, compared to neodymium-iron-boron as used in electric vehicles(2021)
Authors: Martina Orefice, Wim Dewulf, Karel Van Acker
- A Novel Tomographic Characterisation Approach for Sag and Dross Defects in Metal Additively Manufactured Channels(2021)
Authors: Mirko Sinico, Ann Witvrouw, Wim Dewulf
- Deep learning based porosity segmentation in X-ray CT measurements of polymer additive manufacturing parts(2021)
Authors: Simon Bellens, Patrick Vandewalle, Wim Dewulf
Pages: 336 - 341Number of pages: 6 - Analysis of evaluation systems for product repairability: a case study for washing machines(2021)
Authors: Ellen Bracquene, Jef Peeters, Joost Duflou, Wim Dewulf
- Detection and recognition of batteries on X-Ray images of waste electrical and electronic equipment using deep learning(2021)
Authors: Wouter Sterkens, Dillam Diaz Romero, Toon Goedemé, Wim Dewulf, Jef Peeters
- Measurement of sample stage error motions in cone-beam X-ray computed tomography instruments by minimization of reprojection errors(2021)
Authors: Massimiliano Ferrucci, Wim Dewulf
Pages: 48 - 57