Radiation Hardened Aging Resilient Digital Integrated Circuits in Nanoscale CMOS Technology KU Leuven
long-term reliability of recent CMOS technologies is impacted by different intrinsic degradation mechanisms that progressively alter their electrical characteristics (BTI, HCI, TDDB...). Due to the ongoing aggressive scaling process, those mechanisms exhibit significant dispersions related to the process details and variability. The parametric evolution induced by those mechanisms constitutes a reliability risk, both directly, by compromising ...