Atomic Force Microscope (AFM) Ghent University
Atomic force microscopy (AFM) – is technology, which is typically used for measuring both nanoscale topography and their mechanical properties. An attractive and unique operating modality of AFM is the so-called BioAFM, in which the head of atomic force microscope is positioned on top of an optical/fluorescence microscope. Recent developments in the area of atomic force microscopy enable implementation of various modalities, which permit investigation and measurement of specific characteristics. This infrastructure consists of extension to the already existed BioAFM and includes extension ...