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Estimating the reliability of repeatedly measured endpoints based on linear mixed-effects models. A tutorial Hasselt University KU Leuven
There are various settings in which researchers are interested in the assessment of the correlation between repeated measurements that are taken within the same subject (i.e., reliability). For example, the same rating scale may be used to assess the symptom severity of the same patients by multiple physicians, or the same outcome may be measured repeatedly over time in the same patients. Reliability can be estimated in various ways, for ...
Reliability Analysis Framework for a Grid-Tied PV-Battery System: Influence of PV and Battery Degradation on Reliability of Power Electronic Systems Hasselt University
This paper presents a flexible framework to evaluate the reliability of power electronic systems used within a grid-connected PV-battery system. As a practical example to show the capability of this framework, the life consumption (LC) of power semiconductors (IGBTs and diodes) is determined considering both solar panel and lithium-ion battery degradation. Different panel degradation rates can be defined to the framework. The battery degradation ...
Fair Reliability Management: Comparing Deterministic and Probabilistic Short-Term Reliability Management KU Leuven
© 2018 IEEE. Fairness is considered important in various contexts. Although electricity is an essential public good in modern societies that should be affordable and accessible on a fair, nondiscriminatory basis, there is no assessment of fairness in a power system reliability context. Nevertheless, fairness might become an issue with probabilistic short-term reliability management approaches that enable system operators to differentiate between ...
Evaluation of Power System Reliability Management: Towards Socially Acceptable Short-term Reliability Criteria KU Leuven
An adequate level of reliability in power systems is crucial due to the criticality of reliable, but affordable electricity supply for society. Nowadays, power system reliability is managed based on the deterministic N-1 criterion. This N-1 approach does not aim at cost-optimality and is challenged by the evolutions in power systems. Probabilistic reliability management on the contrary takes into account risks related to power system ...
Impact of Value of Lost Load on Performance of Reliability Criteria and Reliability Management KU Leuven
Impact of Value of Lost Load on Performance of Reliability Criteria and Reliability Management KU Leuven
© 2015 IEEE. Evaluating the performance of various power system reliability criteria and their management is important in order to obtain a cost effective reliability level of the power system. However, the performance of reliability criteria depends on several parameters, of which one is value of lost load (VoLL). Value of lost load is typically difficult and complex to model, which hampers making a general conclusion about the most appropriate ...
Importance and difficulties of comparing reliability criteria and the assessment of reliability KU Leuven
Due to the importance of reliable electricity supply and the evolutions in the electrical grid, it can be expected that the way in which we assess reliability need to be adapted. At this moment, reliability is commonly assessed deterministically based on an N-1 criterion, while risk-based reliability assessment is widely available in academic works and is used in other industries. However, because of the years of successful use as well as the ...
SiGe channel technology: superior reliability toward ultra-thin EOT devices—Part II: time-dependent variability in nanoscaled devices and other reliability issues KU Leuven
The time-dependent variability of nanoscaled Si0.45 Ge 0.55 pFETs with varying thicknesses of the Si passivation layer is studied. Single charge/discharge events of gate oxide defects are detected by measuring negative bias-temperature instability (NBTI)-like threshold voltage (V th) shift relaxation transients. The impact of such individually charged defect on device Vth is observed to be exponentially distributed. SiGe channel devices with a ...