Nanoscale Chemical Analysis Beyond the Diffraction Limit: AFM-IR and s-SNOM (AFM-IR AND S-SNOM) KU Leuven
Atomic force microscopy-infrared spectroscopy (AFM-IR) is
an analytical technique that enables chemical
characterization of materials with nanometer scale spatial
resolution. In AFM-IR, IR laser light is focused onto the area
of the sample directly underneath the tip of an AFM. The
absorption of IR radiation by the sample causes local
thermal expansion which is detected by the AFM probe.
The equipment essentially measures IR spectra from
nanometer scale regions of the sample. It can also create
chemical composition maps that show the spatial ...