Modeling and design for reliability of analog integrated circuits in nanometer CMOS technologies KU Leuven
Advanced scaling of CMOS technology in the nanometer range allows to design highly integrated mixed-signal systems, but also poses many challenges due to increased variability and reliability problems. Both have to be addressed by the designer, at IC design time or at IC run time. Design tools for the efficient analysis of reliability problems in analog circuits are described. This allows identifying potential ageing problems in circuits. In ...