Electromigration Mechanics in Scaled Interconnects KU Leuven
Electromigration (EM) is a mass transport phenomenon resulting from the momentum transfer between the electrons and metal ions in a conductor. This mass transport may eventually lead to voids in the metal line, which can result in failure of the entire electronic component. Electromigration is of large concern for the reliability of electronic interconnects; understanding the mechanisms by which it is caused is of foremost importance in ...