Fast scanning chip calorimetry combined with time resolved X-ray diffraction: a new view on polymer crystallization and melting KU Leuven
In the last decades, different fast scanning calorimetry (FSC) techniques have been developed, able to operate at scanning rates up to 40000 °C/s and higher. To allow for such rates, sub microgram samples are required. Relating calorimetric events to structural changes in minute amounts of material is a major challenge in high speed calorimetry. To be able to characterize materials under FSC conditions, we developed a unique setup, combining ...