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Onderzoeker
Umberto Celano
- Disciplines:Klassieke fysica, Elementaire deeltjesfysica en hoge-energie fysica, Andere fysica, Toegepaste wiskunde, Kwantumfysica, Nucleaire fysica, Fysica van gecondenseerde materie en nanofysica, Onderwijskunde
Affiliaties
- Kern- en Stralingsfysica (IKS) (Afdeling)
Lid
Vanaf16 jun 2011 → 31 dec 2015
Projecten
1 - 1 of 1
- Physical mechanisms in ionic conductive bridging devices as studied by nanoscopic observation and manipulation.Vanaf15 jun 2011 → 31 dec 2015Financiering: IWT persoonsgebonden financ. - strategische onderzoeksbeurzen
Publicaties
1 - 6 van 6
- Operating-Current Dependence of the Cu-Mobility Requirements in Oxide-Based Conductive-Bridge RAM(2015)
Auteurs: Attilio Belmonte, Umberto Celano, Wilfried Vandervorst, Michel Houssa
Pagina's: 775 - 777 - Analysis of the Excellent Memory Disturb Characteristics of a Hourglass-Shaped Filament in Al2O3/Cu-Based CBRAM Devices(2015)
Auteurs: Attilio Belmonte, Umberto Celano, Wilfried Vandervorst, Michel Houssa
Pagina's: 2007 - 2013 - Fast and stable sub-10µA pulse operation in W/SiO2/Ta/Cu 90nm 1T1R CBRAM(2015)
Auteurs: Attilio Belmonte, Andrea Fantini, Umberto Celano, Wilfried Vandervorst, Michel Houssa
Pagina's: 193 - 196 - RRAMs based on anionic and cationic switching: a short overview(2014)
Auteurs: Andrea Fantini, Umberto Celano, Attilio Belmonte, Leqi Zhang, Wilfried Vandervorst, Stefan De Gendt
Pagina's: 501 - 511 - Optimization of W/Al2O3/Cu(-Te) material stack for high-performance conductive-bridge memory cells(2013)
Auteurs: Attilio Belmonte, Umberto Celano, Michel Houssa, Wilfried Vandervorst
Pagina's: 175 - 180 - Carrier type dependence on spatial asymmetry of unipolar resistive switching of metal oxides(2013)
Auteurs: Umberto Celano
Patenten
1 - 6 van 6
- Device for measuring surface characteristics of a material (Inventor)
- A device for measuring surface characteristics of a material (Inventor)
- A method and apparatus for transmission for transmission electron (Inventor)
- Method and apparatus for transmission electron microscopy (Inventor)
- A device and method for two dimensional active carrier profiling of semiconductor components (Inventor)
- A method and apparatus for transmission electron microscopy (Inventor)