- Fault Identification in Batch Processes Using Process Data or Contribution Plots: A Comparative Study(2015)
Auteurs: Sam Wuyts, Geert Gins, Pieter Van den Kerkhof, Jan Van Impe
Pagina's: 1283 - 1288
- Improving classification-based diagnosis of batch processes through data selection and appropriate pretreatment(2015)
Auteurs: Geert Gins, Pieter Van den Kerkhof, Jef Vanlaer, Jan Van Impe
Pagina's: 90 - 101
- The RAYMOND simulation package — Generating RAYpresentative MONitoring Data to design advanced process monitoring and control algorithms(2014)
Auteurs: Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof, Jan Van Impe
Pagina's: 108 - 118
- Extending statistical models for batch-end quality prediction to batch control(2013)
Auteurs: Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof, Jan Van Impe
Pagina's: 40 - 54
- Multivariate assessment of activated sludge stability in lab-scale experiments(2013)
Auteurs: Pieter Van den Kerkhof, Geert Gins, Rob Van den Broeck, Jan Van Impe
Pagina's: 1789 - 1793
- Contribution plots for Statistical Process Control: analysis of the smearing-out effect(2013)
Auteurs: Pieter Van den Kerkhof, Geert Gins, Jan Van Impe
Pagina's: 428 - 433
- Online batch fault diagnosis with Least Squares Support Vector Machines(2012)
Auteurs: Pieter Van den Kerkhof, Jef Vanlaer, Geert Gins, Jan Van Impe
Pagina's: 432 - 437
- Extending discrete batch-end quality optimization to online implementation(2012)
Auteurs: Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof, Jan Van Impe
Pagina's: 910 - 915
- The influence of input and output measurement noise on batch-end quality prediction with Partial Least Squares(2012)
Auteurs: Jef Vanlaer, Pieter Van den Kerkhof, Geert Gins, Jan Van Impe
Pagina's: 121 - 135
- Measurement noise influence on statistical properties of batch-end quality predictions(2012)
Auteurs: Jef Vanlaer, Pieter Van den Kerkhof, Geert Gins, Jan Van Impe
Pagina's: 250 - 255