Chemical microscopy of extractives on fibre and paper surfaces

Chemical microscopy methods are nanoscale measurements that couple spatial resolution with chemical specificity. Among the techniques available, time-of-flight secondary ion mass spectrometry (ToF-SIMS) has unique capabilities of imaging combined with surface mass spectrometry, while x-ray photoelectron spectroscopy (XPS) is useful for estimation of surface components and their different oxidation states. In this chapter we describe our previous investigations on the distribution and composition of extractives in pulp fibers and newsprint papers using a combination of XPS and ToF-SIMS analyses. Our results suggest that extractives are usually evenly distributed on fiber and paper surfaces, and that the surface coverage by extractives is affected by the pulping and papermaking processes rather than by the wood itself. We suggest that extractives play an important role in the nanostructure and surface energy of fiber and paper surfaces and that the role of extractives should be carefully investigated when innovative fiber and paper products are designed. © 2008 Blackwell Publishing Ltd.

ISBN:1405158808

Jaar van publicatie:2009