Publicatie

Role of Local Chemical Potential of Cu on Data Retention Properties of Cu-Based Conductive-Bridge RAM

Tijdschrift: IEEE Electron Device Letters

ISSN: 0741-3106

Issue: 2

Volume: 37

Pagina's: 173 - 175

Jaar van publicatie:2016

BOF-keylabel:ja

IOF-keylabel:ja

BOF-publication weight:1

CSS-citation score:1

Auteurs:International

Authors from:Government, Higher Education