Onderzoeker
Kilian Devloo-Casier
- Disciplines:Nanofysica en nanosystemen, Oppervlakten, interfaces, 2D-materialen
Affiliaties
- Vakgroep Vastestofwetenschappen (Departement)
Lid
Vanaf8 jul 2010 → 25 sep 2016
Publicaties
21 - 30 van 39
- In situ XAS and XRF study of nanoparticle nucleation during O3-based Pt deposition(2013)
Auteurs: Matthias Filez, Hilde Poelman, Ranjith Karuparambil Ramachandran, Jolien Dendooven, Kilian Devloo-Casier, E. Fonda, Christophe Detavernier
Aantal pagina's: 1 - In situ characterization of atomic layer deposition in mesoporous thin films by grazing incidence small angle x-ray scattering(2013)
Auteurs: Jolien Dendooven, Kilian Devloo-Casier, Matthias Ide, Kathryn Grandfield, Karl Ludwig, Pascal Van Der Voort, Sara Bals, Christophe Detavernier
Aantal pagina's: 1 - Low temperature plasma-enhanced ALD of vanadium nitride as copper diffusion barrier(2013)
Auteurs: Geert Rampelberg, Kilian Devloo-Casier, Davy Deduytsche, Marc Schaekers, Nicolas Blasco, Christophe Detavernier
Aantal pagina's: 1 - Atomic layer deposition of platinum : GISAXS study of the initial island growth mode(2013)
Auteurs: Jolien Dendooven, Ranjith Karuparambil Ramachandran, Kilian Devloo-Casier, Karl Ludwig, Christophe Detavernier
Aantal pagina's: 1 - Low temperature plasma-enhanced atomic layer deposition of thin vanadium nitride layers for copper diffusion barriers(2013)
Auteurs: Geert Rampelberg, Kilian Devloo-Casier, Davy Deduytsche, Marc Schaekers, Nicolas Blasco, Christophe Detavernier
- Atomic layer deposition of TiOU+2082 on surface modified nanoporous low-k films(2013)
Auteurs: Elisabeth Levrau, Kilian Devloo-Casier, Jolien Dendooven, Karl F Ludwig, Patrick Verdonck, Johan Meersschaut, Mikhail R Baklanov, Christophe Detavernier
Pagina's: 12284 - 12289 - Plasma-enhanced atomic layer deposition of thin vanadium nitride layers as a copper diffusion barrier(2013)
Auteurs: Geert Rampelberg, Kilian Devloo-Casier, Davy Deduytsche, Marc Schaekers, Nicolas Blasco, Christophe Detavernier
Aantal pagina's: 1 - Tuning the pore size of ink-bottle mesopores by atomic layer deposition(2012)
Auteurs: Jolien Dendooven, Bart Goris, Kilian Devloo-Casier, Elisabeth Levrau, Ellen Biermans, Mikhail R Baklanov, Karl F Ludwig, Pascal Van Der Voort, Sara Bals, Christophe Detavernier
Pagina's: 1992 - 1994 - In situ monitoring of atomic layer deposition in nanoporous thin films using ellipsometric porosimetry(2012)
Auteurs: Jolien Dendooven, Kilian Devloo-Casier, Elisabeth Levrau, Robbert Van Hove, Sreeprasanth Pulinthanathu Sree, Mikhail R Baklanov, Johan A Martens, Christophe Detavernier
Pagina's: 3852 - 3859 - In situ characterization of ALD in mesoporous thin films by grazing incidence small angle X-ray scattering(2012)
Auteurs: Jolien Dendooven, Kilian Devloo-Casier, Matthias Ide, Kathryn Grandfield, Karl F Ludwig, Pascal Van Der Voort, Sara Bals, Christophe Detavernier
Aantal pagina's: 1