Onderzoeker
Kilian Devloo-Casier
- Disciplines:Nanofysica en nanosystemen, Oppervlakten, interfaces, 2D-materialen
Affiliaties
- Vakgroep Vastestofwetenschappen (Departement)
Lid
Vanaf8 jul 2010 → 25 sep 2016
Publicaties
31 - 39 van 39
- Comparison of three processes for plasma-enhanced ALD of platinum(2012)
Auteurs: Delphine Longrie, Kilian Devloo-Casier, Sven Van den Berghe, Kris Driesen, Christophe Detavernier
Aantal pagina's: 1 - Plasma-enhanced ALD of platinum with OU+2082, NU+2082 and NHU+2083 plasmas(2012)
Auteurs: Delphine Longrie, Kilian Devloo-Casier, Davy Deduytsche, Sven Van den Berghe, Kris Driesen, Christophe Detavernier
Pagina's: Q123 - Q129 - Nanoscale area selective ZnO growth between a monolayer of nanocrystals(2012)
Auteurs: Kilian Devloo-Casier, Jolien Dendooven, Karl Ludwig, Pieter Geiregat, Zeger Hens, Christophe Detavernier
Aantal pagina's: 1 - In situ study of ALD processes using synchrotron-based X-ray fluorescence and scattering techniques(2012)Volume: 50
Auteurs: Jolien Dendooven, Kilian Devloo-Casier, Matthias Ide, Kathryn Grandfield, Karl Ludwig, Sara Bals, Pascal Van Der Voort, Christophe Detavernier, J Elam, S De Gendt, et al.
Pagina's: 35 - 42 - A rotary reactor for thermal and plasma-enhanced atomic layer deposition on powders and small objects(2012)
Auteurs: Delphine Longrie, Kilian Devloo-Casier, Johan Haemers, Kris Driesen, Christophe Detavernier
Aantal pagina's: 1 - In situ synchrotron based x-ray fluorescence and scattering measurements during atomic layer deposition: initial growth of HfO2 on Si and Ge substrates(2011)
Auteurs: Kilian Devloo-Casier, Jolien Dendooven, KF Ludwig, G Lekens, J D'Haen, Christophe Detavernier
- In situ x-ray characterization and electron tomography study of ALD coatings in mesoporous thin films(2011)
Auteurs: Jolien Dendooven, Ellen Biermans, Elisabeth Levrau, Kilian Devloo-Casier, Karl Ludwig, Pascal Van Der Voort, Sara Bals, Christophe Detavernier
Aantal pagina's: 1 - Characterization of ALD coatings in nanoporous thin films by ellipsometric porosimetry(2011)
Auteurs: Jolien Dendooven, Sreeprasanth Pulinthanathu Sree, Robbert Van Hove, Kilian Devloo-Casier, Mikhail Baklanov, Johan Martens, Christophe Detavernier
Aantal pagina's: 1 - In situ GISAXS during atomic layer deposition(2011)
Auteurs: Kilian Devloo-Casier, Jolien Dendooven, Karl Ludwig, Christophe Detavernier
Aantal pagina's: 1