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Onderzoeker
Wilfried Vandervorst
- Disciplines:Toegepaste wiskunde, Fysica van gecondenseerde materie en nanofysica, Atoom- en moleculaire fysica, Geofysica, Fysische geografie en omgevingsgeowetenschappen, Andere aardwetenschappen, Aquatische wetenschappen, uitdagingen en vervuiling, Geomatische ingenieurswetenschappen
Affiliaties
- Kwantum-vastestoffysica (Afdeling)
Lid
Vanaf1 aug 2019 → Heden - Kern- en Stralingsfysica (IKS) (Afdeling)
Lid
Vanaf1 okt 2007 → 31 jul 2019 - Departement Elektrotechniek (ESAT) (Departement)
Lid
Vanaf1 okt 1999 → 30 sep 2007
Projecten
31 - 34 of 34
- Ionenbundel-geïnduceerde oppervlaktestructuren op nanoschaal: controle van de morfologische en magnetische eigenschappen.Vanaf1 jan 2010 → 31 dec 2015Financiering: FWO Onderzoeksproject (incl. WEAVE projecten)
- State-of-the-art bundellijn voor de hoge-stroominplanter van het Ionen- en Moleculaire Bundellaboratorium (IMBL).Vanaf20 okt 2008 → 19 apr 2015Financiering: Hercules - Kleine en middelzware apparatuur
- Twee- en driedimensionale doperingsprofilering van halfgeleider structuren gebaseerd op nanodraden.Vanaf1 okt 2008 → 19 apr 2013Financiering: IWT persoonsgebonden financ. - strategische onderzoeksbeurzen
- Modificatie van de morfologie en functionele eigenschappen van metallische oppervlakken met behulp van laag-energetische ionenbundels.Vanaf1 okt 2008 → 30 sep 2013Financiering: FWO mandaten
Publicaties
1 - 10 van 482
- Micro Four-Point Probe methodology for the in-line electrical characterization of semiconductors and metals in confined volumes(2023)
Auteurs: Steven Folkersma, Wilfried Vandervorst, Janusz Bogdanowicz
- Probing the spatial dimensions of nanoscale patterns with Rutherford backscattering spectrometry(2023)
Auteurs: Niels Claessens, Annelies Delabie, André Vantomme, Wilfried Vandervorst, Johan Meersschaut
Pagina's: 174 - 181 - Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry(2022)
Auteurs: Niels Claessens, Annelies Delabie, André Vantomme, Wilfried Vandervorst, Johan Meersschaut
- OrbitrapTM-SIMS analysis of advanced semiconductor inorganic structures(2022)
Auteurs: Wilfried Vandervorst
- A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography(2022)
Auteurs: Claudia Fleischmann, Wilfried Vandervorst
Pagina's: 1102 - 1115 - Ensemble RBS: Probing the compositional profile of 3D microscale structures(2022)
Auteurs: Niels Claessens, Wilfried Vandervorst, André Vantomme, Johan Meersschaut
- Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopy(2021)
Auteurs: Wilfried Vandervorst
Pagina's: 34531 - 34551 - Light interactions with periodic nanoline arrays for nanoelectronic applications(2021)
Auteurs: Andrzej Gawlik, Wilfried Vandervorst
- Point defect formation near the epitaxial Ge(001) growth surface and the impact on phosphorus doping activation(2021)
Auteurs: Wilfried Vandervorst
- Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties(2021)
Auteurs: Claudia Fleischmann, Wilfried Vandervorst
Patenten
1 - 10 van 10
- A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample (Inventor)
- Device for measuring surface characteristics of a material (Inventor)
- Characterization of regions with different crystallinity in materials (Inventor)
- Method for determining the shape of a sample tip for atom probe tomography (Inventor)
- A device for measuring surface characteristics of a material (Inventor)
- A method and apparatus for transmission for transmission electron (Inventor)
- A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample (Inventor)
- Method and apparatus for transmission electron microscopy (Inventor)
- A device and method for two dimensional active carrier profiling of semiconductor components (Inventor)
- A method and apparatus for transmission electron microscopy (Inventor)