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Octrooi

Item inspection by dynamic selection of projection angle

A method, system, use, and computer program product for inspection of an item are disclosed. The method (1) comprises acquiring (2) a projection image of the item using a radiation imaging system and obtaining (3) a plurality of simulated projection images of the item or a component thereof, based on a simulation of a numerical three-dimensional model, in which at least one geometric parameter relating to the relative orientation between the simulated item, a simulated radiation source, and a simulated detection plane varies over the plurality of simulated images. The method comprises determining (4) a relative orientation of the item with respect to the imaging system, said determining of the relative orientation comprises comparing (9) the projection image to the plurality of simulated images. The method comprises determining (5) at least one angle of rotation taking a viewing angle and the relative orientation into account, moving (6) the item and/or the imaging system in accordance with the at least one angle of rotation and acquiring (7) a further projection image of the item, after moving the item, such that the further projection image corresponds to a view of the item from the viewing angle.
Octrooi-publicatienummer: WO2020002704
Jaar aanvraag: 2020
Jaar toekenning: 2021
Jaar van publicatie: 2020
Status: Aangevraagd
Technologiedomeinen: Meting
Gevalideerd voor IOF-sleutel: Ja
Toegewezen aan: Associatie Universiteit & Hogescholen Antwerpen