A method for analyzing design of an integrated circuit

A method for analyzing design of an integrated circuit comprises: receiving (100) a design layout for an integrated circuit; forming a plurality of images of portions of the design layout, and for each image of a portion of the design layout: calculating (104) a Fourier transform representation of the image; and extracting (106) values of pre-defined parameters from the Fourier transform representation; comparing (108) the extracted parameter values of the plurality of images to create a clustering model by unsupervised machine learning and to sort each image of a portion of the design layout into a cluster defined by the clustering model; and determining a number of images sorted into at least one cluster defined by the clustering model.

Octrooi-publicatienummer: EP3392712

Jaar aanvraag: 2017

Jaar toekenning: 2019

Jaar van publicatie: 2018

Status: Aangevraagd

Technologiedomeinen: Computertechnologie, Optica

Gevalideerd voor IOF-sleutel: Ja

Toegewezen aan: Associatie KULeuven