< Terug naar vorige pagina

Publicatie

Origin of the performances degradation of two-dimensional-based metal-oxide-semiconductor field effect transistors in the sub-10 nm regime: A first-principles study

Tijdschriftbijdrage - Tijdschriftartikel

© 2016 AIP Publishing LLC. The impact of the scaling of the channel length on the performances of metal-oxide-semiconductor field effect transistors, based on two-dimensional (2D) channel materials, is theoretically investigated, using density functional theory combined with the non-equilibrium Green's function method. It is found that the scaling of the channel length below 10 nm leads to strong device performance degradations. Our simulations reveal that this degradation is essentially due to the tunneling current flowing between the source and the drain in these aggressively scaled devices. It is shown that this electron tunneling process is modulated by the effective mass of the 2D channel material, and sets the limit of the scaling in future transistor designs.
Tijdschrift: Applied Physics Letters
ISSN: 0003-6951
Issue: 4
Volume: 108
Aantal pagina's: 5
Jaar van publicatie:2016
Trefwoorden:Toegepaste natuurkunde