A METHOD FOR DETERMINING THE SPATIAL DISTRIBUTION OF ELECTRICAL CURRENT DENSITY IN A TWO-DIMENSIONAL MATERIAL DEVICE Interuniversitair Micro-Electronica Centrum vzw
A method to find the spatial distribution of in-operando current density in 2D devices is proposed. The main innovation of the invention is a proposed technique to measure the current (density) at the (closed) contact-electrode boundary of the 2D device by a scanning probe used as a current sink. Knowledge of the current density at the boundary allows finding the current density at all internal points by numerical analysis, which can be further refined by additional scanning probe techniques such as nanopotentiometry to find the quasi-Fermi level in the region of analysis. Determination of ...