< Back to previous page
Patent
Label-free analysis of brightfield microscope images
Provided is a training method (100) for training a predictive model, PM, (132) for highlighting cellular objects, c-objects, in a test Brightfield, BF, image of a test sample (202) of one or more c-objects acquired using a test microscope (204) having at least a BF acquisition mode, wherein the training method (100) uses as training data training Brightfield images (112, 112') and training fluorescent images (114, 114') of a fluorescently labelled training sample as ground truth which are automatically generated. It further relates to method for determining characterising parameters of a test sample, assays and screening method on a test sample that can be label-free.
Patent Publication Number: EP4060552
Year filing: 2021
Year approval: 2023
Year publication: 2022
Status: Requested
URI: link to Espacenet
Technology domains: undefined
Validated for IOF-key: Yes
Attributed to: Associatie Universiteit & Hogescholen Antwerpen