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Publication
Exploiting Transistor Folding Layout as RHBD Technique Against Single-Event Transients
Journal Contribution - Journal Article
Journal: IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN: 0018-9499
Issue: 7
Volume: 67
Pages: 1581 - 1589
Publication year:2020
BOF-keylabel:yes
IOF-keylabel:yes
BOF-publication weight:1
CSS-citation score:1
Authors:International
Authors from:Higher Education
Accessibility:Open