protections for system level ESD (PROSE)

This wave-sampling solution will allow to reconstruct an image of the current and/or voltage waveforms occurring on a protected IO pad of a standard IC. The work is targeted specifically at System-ESD type of pulses which form a special family of pulses described in [1]. Application specifications often requires IC's to be able to withstand such pulses during normal operations, hence the need to accurately characterize their shape.
The wave-sampling solution will provide complementary information with respect to other wave-form visualization techniques which will be applied during the project and mainly rely on off-chip calibration devices and hence only enable to reconstruct waveforms at the external IC pins.