Patents

A unit cell (100; 200; 300) for detection of light from a target comprises: a light emitting unit (110; 210; 310) for emitting coherent light towards the target; an extractor (120; 220; 320) for extracting part of the emitted coherent light to form reference light; at least one photo-sensitive element (130, 132; 230a-h; 330, 332), each configured to receive light from the target based on emitted coherent light and to receive reference light for detecting both light from the target and reference light; wherein the unit cell (100; 200; 300) defines an optical path for reference light between ...

This disclosure relates to nanopore arrays. A readout device for a nanopore array is provided, and an analog detection circuit for the readout device. The detection circuit is connectable to a readout electrode of the nanopore array and, in a detection mode, applies a bias voltage to the readout electrode. It extracts a baseline current from an input current flowing through the readout electrode when the bias voltage is applied, and outputs a digital signal indicating that a current event occurred, if the input current changes by a predetermined threshold value compared to the baseline ...

This disclosure relates to nanopores and nanopore arrays. A readout device for a nanopore array is provided, and an analog detection circuit for the readout device. The detection circuit is connectable to a readout electrode of the nanopore array and, in a detection mode, applies a bias voltage to the readout electrode. Further, it extracts a baseline current from an input current flowing through the readout electrode when the bias voltage is applied, and outputs a digital signal indicating that a current event occurred, if the input current changes by a predetermined threshold value compared ...

A phase difference detector (10) for a single target location (24) comprising: a planar waveguide (12) for guiding a laser beam, the planar waveguide having a normal direction (N); a grating coupler (14) to split the laser beam into a reference beam (18) and a measurement beam (16), wherein the measurement beam is directed towards the target location and the reference beam is directed away from the target location, the reference beam and the measurement beam each being inclined with respect to said normal direction; a planar imager array (36) configured to detect a fringe pattern generated by ...

A method for training a local machine learning model is provided. The method includes receiving a scanning electron microscope (SEM) image of semiconductor features. The method additionally includes determining a location and dimensions of a bounding box within the SEM image. The method yet further includes determining, whether a defect feature exists within the bounding box, based on an unsupervised object detection process. The method also includes, if the defect feature exists within the bounding box, receiving positive rewards. The method also includes, if the defect feature does not ...

A federated machine learning method is provided. The method includes providing, from a central model server, an initial trained machine learning (ML) model to a plurality of clients as a respective local ML model. The initial trained ML model is configured to identify defect features from scanning electron microscopy (SEM) images. The method additionally includes receiving, from at least one client by the central model server, information indicative of a respective updated local ML model. The method also includes determining, based on the information indicative of the respective updated local ...

A method for training a local machine learning model is provided. The method includes receiving a scanning electron microscope (SEM) image of semiconductor features. The method additionally includes determining a location and dimensions of a bounding box within the SEM image. The method yet further includes determining, whether a defect feature exists within the bounding box, based on an unsupervised object detection process. The method also includes, if the defect feature exists within the bounding box, receiving positive rewards. The method also includes, if the defect feature does not ...

A federated machine learning method is provided. The method includes providing, from a central model server, an initial trained machine learning (ML) model to a plurality of clients as a respective local ML model. The initial trained ML model is configured to identify defect features from scanning electron microscopy (SEM) images. The method additionally includes receiving, from at least one client by the central model server, information indicative of a respective updated local ML model. The method also includes determining, based on the information indicative of the respective updated local ...

There is provided an integrated device for wavelength dependent detection of light, comprising: a concentrating element comprising a collecting end and a transmitting end, and configured to collect light incident at the collecting end, and to concentrate the light at the transmitting end; a multimode waveguide forming an extension from a receiving end to a distributing end, and surrounded by a host medium along the extension, wherein the transmitting end is coupled to the receiving end, the waveguide being configured to receive the light from the concentrating element at the receiving end, ...

There is provided an integrated device for wavelength dependent detection of light, comprising: a concentrating element comprising a collecting end and a transmitting end, and configured to collect light incident at the collecting end, and to concentrate the light at the transmitting end; a multimode waveguide forming an extension from a receiving end to a distributing end, and surrounded by a host medium along the extension, wherein the transmitting end is coupled to the receiving end, the waveguide being configured to receive the light from the concentrating element at the receiving end, ...