< Back to previous pageInfrastructure Scanning electron microscopeField emission scanning electron microscope (SEM). JEOL JSM7100F Type: Equipment Location type: Single sited Accessibility: Not accessible Url: https://www.plantentuinmeise.be/nl/pQYe7FG/wetenschap/onderzoeksfaciliteiten-en-expertisePartners1 - 1 of 1Meise Botanic Garden (Knowledge institution)Consortium Partner
