Towards 3D-nanochemical analysis: Combined TOFSIMS-SFM infrastructure at the service of R&D in Flanders. (Combined TOFSIMS-SFM)

Time of Flight SIMS (TOFSIMS) is now well established as one of the most powerful concepts for (localized) probing of organic materials, their interactions and modifications, and their interplay with inorganic structures as it has made a tremendous progress in the last decade (instrumentally and theoretically). By establishing a state of the art user facility in TOFSIMS, this project aims at stimulating and facilitating the materials research in Flanders emphasizing those areas where organic materials or the interface organic-inorganic materials plays a dominant role . The strength of the proposed user facility is that it captures the latest developments in instrumentation (including the presence of a Scanning Probe Module allowing real 3D analysis), provides a close interaction with the leading manufacturer and incorporates the leading scientists in the TOFSIMS field. This unique combination ensures that a world class analytical support facility is created generating the metrology required to enable the materials research of the partners.

Type: Facility

Location type: Single sited

Accessibility: Everyone

User modalities: Contact alexis.franquet@imec.be

Disciplines: Materials physics, Materials science and engineering

Keywords: Scanning Force Microscopy (SFM), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), surface analysis, interface, materials characterization, analytical instrumentation