Impact of thinning and through silicon via proximity on high-k / metal gate first CMOS performance

3D integration has the potential to alleviate the performance limitations that CMOS scaling is facing provided that it preserves the integrity of both front end and back end devices and constituting materials. The impact of wafer thinning and of the proximity of through silicon via on active devices, back end structures, ring oscillators and mixed signal circuit are reported for the first time for a High-k/Metal Gate first strained CMOS technology with low-k BEOL. The relative stress induced by the STI and the TSV are measured by micro-Raman spectroscopy. The measured impact of the stress on a sensitive DAC circuit is used to define a safe keep out area. © 2010 IEEE.

ISBN:978-1-4244-7637-4

Publication year:2010

BOF-keylabel:yes

IOF-keylabel:yes

Authors from:Government, Higher Education