< Back to previous pageResearcher Yihong QingDisciplines:Electronic circuit and system reliability, Modelling not elsewhere classifiedAffiliationsElectronic Circuits and Systems (ECS) (Division)MemberFrom13 Oct 2021 → TodayKU LeuvenProjects1 - 1 of 1Modeling and characterization of UT-FDSOI devices and their long term reliability at cryogenic temperaturesFrom24 Sep 2021 → TodayFunding: Own budget, for example: patrimony, inscription fees, giftsPublications1 - 1 of 1An improved test methodology for detecting one-case latent damage in inverter circuit under ESD pulses(2022)Authors: Yihong Qing
