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Project
International Joint Research Group Holographic imaging and display - HOLO (OZR4433)
Digital holography is a scientific discipline that measures or reconstructs the wavefield of light through interference. The wavefield encodes threedimensional (3D) information, having applications in interferometry, microscopy, ultrafast imaging, data storage, and 3D displays.
Modeling numerical diffraction is highly computationally costly since holography relies on wave-based models of light, accounting for the coherence of light. Moreover, the properties and statistics of holographic signals differ substantially from natural photographic imagery. That is why novel mathematical transforms and algorithms should be designed in conjunction with custom-built optical setups and specialized hardware to solve the problem of efficiently representing, generating, and reconstructing holograms.
Our goal is to leverage complementary research experience in holographic signal processing of the LRG ETRO.RDI in Brussels and the expertise of the Graduate School of Engineering at Chiba University, which fits into the strategic research activities of our respective departments.
Modeling numerical diffraction is highly computationally costly since holography relies on wave-based models of light, accounting for the coherence of light. Moreover, the properties and statistics of holographic signals differ substantially from natural photographic imagery. That is why novel mathematical transforms and algorithms should be designed in conjunction with custom-built optical setups and specialized hardware to solve the problem of efficiently representing, generating, and reconstructing holograms.
Our goal is to leverage complementary research experience in holographic signal processing of the LRG ETRO.RDI in Brussels and the expertise of the Graduate School of Engineering at Chiba University, which fits into the strategic research activities of our respective departments.
Datum:8 okt 2025 → Heden
Trefwoorden:International Joint Research Group, Holography
Disciplines:Dimensionale metrologie