Fully automatic subpixel image registration of multiangle CHRIS/Proba data

Korte inhoud:Subpixel image registration is the key to successful image fusion and superresolution enhancement of multiangle satellite data. Multiangle image registration poses two main challenges: 1) Images captured at large view angles are susceptible to resolution change and blurring, and 2) local geometric distortion caused by topographic effects and/or platform instability may be important. In this paper, we propose a two-step nonrigid automatic registration scheme for multiangle satellite images. In the first step, control points (CPs) are selected in a preregistration process based on the scale-invariant feature transform (SIFT). However, the number of CPs obtained in this first step may be too few and/or CPs may be unevenly distributed. To remediate these problems, in a second step, the preliminary registered image is subdivided into chips of 64 x 64 pixels, and each chip is matched with a corresponding chip in the reference image using normalized cross correlation (NCC). By doing so, more CPs with better spatial distribution are obtained. Two criteria are applied during the generation of CPs to identify outliers. Selected SIFT and NCC CPs are used for defining a nonrigid thin-plate-spline model. The proposed registration scheme has been tested using data from the Compact High Resolution Imaging Spectrometer (CHRIS) onboard the Project for On-Board Autonomy (Proba) satellite. Experimental results demonstrate that the proposed method works well in areas with little variation in topography. Application in areas with more pronounced relief would require the use of orthorectified image data in order to achieve subpixel registration accuracy.

Jaar van publicatie:2010

Trefwoorden:automatic registration, CHRIS/Proba, m-estimator sample consensus (MSAC), normalized cross correlation (NCC), scale-invariant feature transform (SIFT), thin plate spline (TPS), Elektronica en elektrotechniek, Toegepaste natuurkunde, Geowetenschappen en technologie

Reviewstatus:Peerreview