Operational lifetime prediction of photovoltaic devices. Interuniversitair Micro-Electronica Centrum vzw
The present invention relates to a method (100) for estimating the operational lifetime of a thin-film photovoltaic cell. The method comprises obtaining (101) a time series of data which are indicative of environmental conditions as dependent on time, estimating (102) the efficiency of the thin-film photovoltaic cell at a plurality of points in time and outputting (109) at least one value indicative of the operational lifetime based on the plurality of efficiency estimates obtained for the plurality of points in time. The estimation comprises, for each point of time, determining (103) a ...