Atomic force microscopy probes with an assembly of metal nanowires and dielectrophoretic method for attaching and detaching said metal nanowires to and from said probes KU Leuven
The present invention relates to (i) a commercially available atomic force microscopy cantilever with an assembly of chemically-synthesized noble metal nanowires attached to it, without the use of an adhesive, (ii) controllable methods to attach an assembly of chemically-synthesized noble metal nanowires to said cantilever and (iii) the use of the commercially available atomic force microscope cantilever with assembly of nanowires in techniques such as surface topographic scanning with atomic force microscopy, nanoscale chemical analysis using near-field optical microscopy and with particular ...