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Onderzoeker
Jacopo Franco
- Disciplines:Sensoren, biosensoren en slimme sensoren, Andere elektrotechniek en elektronica, Nanotechnologie, Ontwerptheorieën en -methoden
Affiliaties
- Elektronische Circuits en Systemen (ECS) (Afdeling)
Lid
Vanaf1 aug 2020 → 31 jan 2013 - Afdeling ESAT - MICAS, Micro-elektronica en Sensoren (Afdeling)
Lid
Vanaf1 feb 2009 → 31 jan 2013
Publicaties
1 - 10 van 88
- Record performance InGaAs homo-junction TFET with superior SS reliability over MOSFET(2015)
Auteurs: Ali Reza Alian, Jacopo Franco, Anne Verhulst, Devin Verreck
Pagina's: 823 - 826 - On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires(2015)
Auteurs: Geert Hellings, Hiroaki Arimura, Jacopo Franco
Pagina's: 366 - 369 - NBTI in Si0.55Ge0.45 cladding p-FinFETs: porting the superior reliability from planar to 3D architectures(2015)
Auteurs: Jacopo Franco, Guido Groeseneken
Pagina's: 41 - 45 - Extraction of the random component of time-dependent variability using matched pairs(2015)
Auteurs: Jacopo Franco, Guido Groeseneken
Pagina's: 300 - 302 - Ge nFET with high electron mobility and superior PBTI reliability enabled by monolayer-Si surface passivation and La-induced interface dipole formation(2015)
Auteurs: Hiroaki Arimura, Sonja Sioncke, Daire Cott, Jerome Mitard, Thierry Conard, Wendy Vanherle, Roger Loo, Paola Favia, Hugo Bender, Johan Meersschaut, et al.
Pagina's: 588 - 591 - Gate-all-around InGaAs nanowire FETs with peak transconductance of 2200 µS/µm at 50nm Lg using a replacement fin RMG flow(2015)
Auteurs: Niamh Waldron, Jacopo Franco, Abhitosh Vais, Clement Merckling, Kristin De Meyer
Pagina's: 3111 - 3114 - AC NBTI of Ge pMOSFETs: impact of energy alternating defects on lifetime prediction(2015)
Auteurs: Jacopo Franco, Guido Groeseneken
Aantal pagina's: 2 - Characterization and simulation methodology for time-dependent variability in advanced technologies(2015)
Auteurs: Jacopo Franco, Marko Simicic, Francky Catthoor, Guido Groeseneken
Pagina's: 1 - 8 - TCAD-based methodology for reliability assessment of nanoscaled MOSFETs(2015)
Auteurs: Jacopo Franco
Pagina's: 270 - 273 - Si-cap-free SiGe p-channel Fin FETS and gate-all-around transistors in a replacement metal gate Process: interface trap density reduction and performance improvement by high-pressure deuterium anneal(2015)
Auteurs: Hiroaki Arimura, Jacopo Franco, Diana Tsvetanova
Pagina's: 142 - 143
Patenten
1 - 2 van 2
- Breakdown-based physical unclonable function (Inventor)
- Breakdown-based physical unclonable function (Inventor)